"Kouhei Akita,Jun Kanehara,Hiroshi Nohira,Y. Izumi,TAKAYUKI MURO,木下豊彦,パールハットアヘメト,Kuniyuki KAKUSHIMA,KAZUO TSUTSUI,takeo hattori,HIROSHI IWAI","[517]	Y. Miyata, K. Akita, J. Kanehara, H. Nohira, Y. Izumi, T. Muro, T. Kinoshita, P. Analysis of Boron Doped in Si Fin Structure by Soft X-ray Photoelectron Spectroscopy","G-COE PICE International Symposium and IEEE EDS Minicolloquium on Advanced Hybrid Nano Devices: Prospects by World’s Leading Scientists",,,,,,2013,
"金原潤,宮田陽平,秋田洸平,筒井一生,野平博司,室隆桂之,木下豊彦,パールハットアヘメト,角嶋邦之,服部健雄,岩井洋","Si中に極浅ドープされたAsの軟X線光電子分光による化学結合状態の検出とその深さ方向分布","第72回応用物理学会学術講演会",,,,,,2011,