"Atsuki Miyata,Takuya Hoshii,Hitoshi Wakabayashi,KAZUO TSUTSUI,Kuniyuki KAKUSHIMA","Suppression of decay time in transient drain current of back-gated GaN HEMT under UV exposure",,"Japanese Journal of Applied Physics",," 61"," SH"," SH1005",2022,Apr. "A. Miyata,T. Hoshii,H. Wakabayashi,K. Tsutsui,K. Kakushima","Photocurrent measurements of AlGaN/GaN HEMT under X-ray irradiation","Electrochemical Society (ECS) PRIME 2020",,,,,,2020,Oct. "‹{“c “ÄŠó,âV“¡ ‘åŽ÷,¯ˆä ‘ñ–ç,Žá—Ñ ®,“›ˆä ˆê¶,Šp“ˆ –M”V","4H-SiCƒGƒsƒ^ƒLƒVƒƒƒ‹‘w‚É‚æ‚éXüŒŸo‚ÉŠÖ‚·‚錟“¢","‘æ80‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ï",,,,,,2019,Sept.