"Minjae Yoon,K. Terayama,A. Nakajima,S. Nichizawa,H. Ohasi,K. Kakushima,H. Wakabayashi,K. Tsutsui,H. Iwai","Investigation into scaling law in AlGaN/GaN Fin field effect transistors by device simulation","The Workshop on Future Trend of Nanoelectronics: WIMNACT 39",,,,,,2014,Feb.