"Michihiro Shintani,Takumi Uezono,Tomoyuki Takahashi,Hiroyuki Ueyama,Takashi Sato,Kasumi Hatayama,Takashi Aikyo,Kazuya Masu","An Adaptive Test for Parametric Faults Based on Statistical Timing Information","IEEE Asian Test Symposium","IEEE Asian Test Symposium","IEEE Asian Test Symposium",,,"pp. 151-156",2009,Nov.
"Takashi Sato,Hiroyuki Ueyama,Noriaki Nakayama,Kazuya Masu","Accurate array-based measurement for subthreshold-current of MOS",,"IEEE Journal of Solid-State Circuits","IEEE Journal of Solid-State Circuits","Vol. 44","No. 11","pp. 2977-2986",2009,Nov.
"Tomoyuki Takahashi,Takumi Uezono,Michihiro Shintani,Kazuya Masu,Takashi Sato","On-die parameter extraction from path-delay measurements","2009 IEEE Asian Solid-State Circuits Conference","2009 IEEE Asian Solid-State Circuits Conference","IEEE Asian Solid-State Circuits Conference",,,"pp. 101 - 104",2009,Nov.
"Tomoyuki Takahashi,takumi uezono,Hiroyuki Ochi,Kazuya Masu,Takashi Sato","パス遅延測定によるチップ特性の推定手法","DAシンポジウム","DAシンポジウム","DAシンポジウム",,,"pp. 133-138",2009,Aug.