"T.Murooka,K.Takizawa,Y.Kato,T.Makino,M.Ogura,H.Kato,R.Wada,S.Yamasaki,T.Iwasaki,H.Nohira,M.Hatano","Process Damage Influence for Electrical Property of Diamond Schottky Barrier Diodes","2018International Conference on Solid State Devices and Materials",,,,,,2018,Sept.
"Žº‰ª ‘ñ–ç,–î” ��–ç,Šâ�è �F”V,–q–ì �r�°,�¬ ‘q �­•F,‰Á“¡ ’ˆŒõ,Natal Meralys,Saddow Stephen E.,ŽR�è ‘�,”g‘½–ì –rŽq","3C-SiC/Si Šî”Â�ã‚ÉŒ`�¬‚µ‚½ƒwƒeƒ�ƒGƒsƒ^ƒLƒVƒƒƒ‹ƒ_ƒC ƒ„ƒ‚ƒ“ƒhSBD ‚Ì“d‹C“Á�«","‘æ65‰ñ‰ž—p•¨—�Šw‰ï �t‹GŠw�p�u‰‰‰ï",,,,,,2018,Mar.
"T. Murai,T. Makino,H. Kato,M. Shimizu,T.Murooka,D. E. Herbschleb,Y. Doi,H. Morishita,M. Fujiwara,M. Hatano,S. Yamasaki,N. Mizuochi","Engineering of Fermi level by nin diamond junction for control of charge states of NV centers",,"Applied Physics Letters",,"Vol. 112",,"pp. 111903.1-4",2018,Mar.