"丹下貴志","収差補正走査透過電子顕微鏡解析を用いたInGaN量子井戸の微細構造と発光効率低下に関する研究",,,,,,,2021,Mar.
"丹下 貴志","収差補正走査透過電子顕微鏡解析を用いたInGaN量子井戸の微細構造と発光効率低下に関する研究",,,,,,,2021,Mar.
"丹下 貴志","収差補正走査透過電子顕微鏡解析を用いたInGaN量子井戸の微細構造と発光効率低下に関する研究",,,,,,,2021,Mar.
"Takashi Tange,Taeko Matsukata,Takumi Sannomiya","Structural and Luminescence Characteristics of Trench Defects in Red-emitting InGaN/GaN on Single-crystal GaN Substrate","2020 International Conference on Solid State Devices and Materials",,,,,,2021,