"Sangyeop Lee,Masao Fujita,Masayuki Toyoda,Kyoya Takano,Shinsuke  Hara,Watanabe Issei,Akifumi Kasamatsu,Shuhei Amakawa,Takeshi Yoshida,Hiroyuki Ito","A transparent band-pass-filtered reflector for IEEE Standard 802.15.3d","IEEE Asia-Pacific Microwave Conference",,,,,,2022,Nov.
"—›�®ž@,“¡“c�^’j,�‚–싱–í,Œ´�a‰î,“n粈ê�¢,Š}�¼�ÍŽj,ˆÉ“¡�_”V","300GHz‘Ñ�L‘шæ“d”g‹zŽû‘Ì‚ÌŒ¤‹†ŠJ”­","ƒVƒ“ƒ|ƒWƒEƒ€�uƒeƒ‰ƒwƒ‹ƒc‰ÈŠw‚Ì�Å�æ’[?�v",,,,,,2022,Nov.
"Sangyeop Lee,Masao Fujita,Masayuki Toyoda,Kyoya Takano,Shinsuke  Hara,Watanabe Issei,Akifumi Kasamatsu,Hiroyuki Ito","Sub-terahertz electromagnetic-wave absorber for future wireless communication","IEEE International Symposium on Frequency Integration Technology",,,,,,2022,Aug.
"Masao Fujita,Sangyeop Lee,Kyoya Takano,Masayuki Toyoda,Shinsuke  Hara,Watanabe Issei,Akifumi Kasamatsu","Development of Terahertz EM-wave Absorber","IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition",,,,,,2022,Aug.
"Shinsuke  Hara,Ruibing Dong,Sangyeop Lee,Kyoya Takano,Naoya Toshida,Akifumi Kasamatsu,Kunio Sakakibara,Takeshi Yoshida,Shuhei Amakawa,Minoru Fujishima","A 76-Gbit/s 265-GHz CMOS receiver with WR-3.4 waveguide interface",,"IEEE Journal of Solid-State Circuits",,,,,2022,July
"Sangyeop Lee,Masao Fujita,Masayuki Toyoda,Kyoya Takano,Shinsuke  Hara,Issei Watanabe,Akifumi Kasamatsu,Hiroyuki Ito","Ultra-wideband electromagnetic-wave absorber for IEEE 802.15.3d","Global Symposium on Millimeter Waves",,,,,,2022,May
"“¡“c�^’j,–L“c�«”V,—›�®ž@,Œ´�a‰î,“n粈ê�¢,Š}�¼�ÍŽj,�‚–싱–í","’´�‚Žü”g‘Ñ“d”g‹zŽûƒV�[ƒg‚Ì�ÝŒvŽw�j‚Æ‚»‚ÌŠJ”­","“dŽq�î•ñ’Ê�MŠw‰ï‘��‡‘å‰ï",,,,,,2022,Mar.
"—›�®ž@,“¡“c�^’j,–L“c�«”V,�‚–싱–í,Œ´�a‰î,“n粈ê�¢,Š}�¼�ÍŽj,ˆÉ“¡�_”V","—U“d‘̂̃eƒ‰ƒwƒ‹ƒc‘Ñ‘ª’茋‰Ê‚É‚æ‚é“d”g‹zŽû‘Ì�ÝŒv","“dŽq�î•ñ’Ê�MŠw‰ïƒ}ƒCƒNƒ�”gŒ¤‹†‰ï",,,,,,2022,Mar.
"Sangyeop Lee,Kosuke Katayama,Kyoya Takano,Masao Fujita,Masayuki Toyoda,Shinsuke  Hara,Issei Watanabe,Akifumi Kasamatsu,Shuhei Amakawa,Takeshi Yoshida,Minoru Fujishima","300-GHz back-radiation on-chip-antenna measurement with electromagnetic-wave-absorption sheet","IEEE International Conference on Microelectronic Test Structures",,,,,,2022,Mar.