"’|‘ºWˆê,•Ð–ì’B‹M,‰Í“Y—‰›,Insung Seo,”Ñ·‘ñŽk,¬X•¶•v,¬àVŒ’ˆê,ŠÔ£ˆê•F,‡“c‹`O,•½ŽR”Ž”V,’†’ÒŠ°","SiC(0001)Šî”Âã‚ɬ’·‚µ‚½ƒOƒ‰ƒtƒFƒ“‚Ö‚ÌFeƒCƒ“ƒ^[ƒJƒŒ[ƒVƒ‡ƒ“","“ú–{•¨—Šw‰ï2023”Nt‹G‘å‰ï",,,,,,2023,Mar. "’·”ör—C,‘å“à‘ñŽÀ,‰Z¶“µ”ü,D“cFK,”Ñ·‘ñŽk,¬X•¶•v,’†’ÒŠ°,•½ŽR”Ž”V","Si(111)ã3~ã3-Ag •\–Êã‚ÌBi(110)’´”––Œ‚Ì“dŽqó‘Ô","“ú–{•¨—Šw‰ï2023”Nt‹G‘å‰ï",,,,,,2023,Mar. "‰Z¶“µ”ü,’·”ör—C,•½ŽR”Ž”V,’†’ÒŠ°","(In,Bi)/Si(111)•\–Ê‚ÌŒ´Žq\‘¢","“ú–{•¨—Šw‰ï2023”Nt‹G‘å‰ï",,,,,,2023,Mar. "T. Shirasawa,W. Voegeli,E. Arakawa,R. Ushioda,K. Nakatsuji,H. Hirayama","Structural transition at the subsurface of few-layer Bi(110) film during the growth",,"Physical Review Materials..",,"Volume 7",," 033404",2023,Mar. "M. Shimura,T. Shirasawa,R. Ushioda,K. Nakatsuji,H. Hirayama","Growth kinetics of a perfectly flat Bi(110) film during low-temperature deposition and subsequent annealing",,"Surface Science",,"Volume 728",," 122210",2023,Feb.