@article{CTT100869433,
  author = {Akifumi Maru and Akifumi Matsuda and Satoshi Kuboyama and Mamoru Yoshimoto},
  title = {Simulation-Based Understanding of “Charge-Sharing Phenomenon” Induced by Heavy-Ion Incident on a 65nm Bulk CMOS Memory Circuit},
  journal = {IEICE Transactions on Electronics},
  year = 2022,
}

@inproceedings{CTT100772000,
  author = {Akifumi Maru and Akifumi Matsuda and MAMORU YOSHIMOTO},
  title = {A Study on Single Event Mitigation Techniques for Nano-Scale Semiconductor Devices},
  booktitle = {},
  year = 2018,
}

@inproceedings{CTT100771916,
  author = {Akifumi Maru and Akifumi Matsuda and MAMORU YOSHIMOTO},
  title = {A Study of Single Event Mitigation Techniques for Nano-Scale Semiconductor Devices},
  booktitle = {},
  year = 2018,
}

@misc{CTT100860906,
  author = {Akifumi Maru},
  title = {Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices},
  year = 2021,
}

@misc{CTT100860907,
  author = {Akifumi Maru},
  title = {Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices},
  year = 2021,
}

@misc{CTT100891757,
  author = {Akifumi Maru},
  title = {Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices},
  year = 2021,
}



@phdthesis{CTT100860906,
  author = {Akifumi Maru},
  title = {Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices},
  school = {Tokyo Institute of Technology},
  year = 2021,
}

@phdthesis{CTT100860907,
  author = {Akifumi Maru},
  title = {Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices},
  school = {Tokyo Institute of Technology},
  year = 2021,
}

@phdthesis{CTT100891757,
  author = {Akifumi Maru},
  title = {Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices},
  school = {Tokyo Institute of Technology},
  year = 2021,
}