@inproceedings{CTT100607559, author = {Takumi Uezono and Tomoyuki Takahashi and Michihiro Shintani and Kazumi Hatayama and Kazuya Masu and Hiroyuki Ochi and Takashi Sato}, title = {Scan Based Process Parameter Estimation Through Path-Delay Inequalities}, booktitle = {IEEE International Symposium on Circuits and Systems (ISCAS 2010)}, year = 2010, } @inproceedings{CTT100592695, author = {Tomoyuki Takahashi and Takumi Uezono and Michihiro Shintani and Kazuya Masu and Takashi Sato}, title = {On-die parameter extraction from path-delay measurements}, booktitle = {2009 IEEE Asian Solid-State Circuits Conference}, year = 2009, } @inproceedings{CTT100604868, author = {Michihiro Shintani and Takumi Uezono and Tomoyuki Takahashi and Hiroyuki Ueyama and Takashi Sato and Kasumi Hatayama and Takashi Aikyo and Kazuya Masu}, title = {An Adaptive Test for Parametric Faults Based on Statistical Timing Information}, booktitle = {IEEE Asian Test Symposium}, year = 2009, } @inproceedings{CTT100604892, author = {Tomoyuki Takahashi and takumi uezono and Hiroyuki Ochi and Kazuya Masu and Takashi Sato}, title = {パス遅延測定によるチップ特性の推定手法}, booktitle = {DAシンポジウム}, year = 2009, } @inproceedings{CTT100590958, author = {Michihiro Shintani and Tomoyuki Takahashi and Hiroyuki Ueyama and takumi uezono and Takashi Sato and Kasumi Hatayama and Takashi Aikyo and Kazuya Masu}, title = {Adaptive Test Based on Statistical Timing Information}, booktitle = {2009 年 電子情報通信学会総合大会}, year = 2009, } @inproceedings{CTT100590959, author = {Takumi Uezono Tomoyuki Takahashi Hiroyuki Ueyama Michihiro Shintani Takashi Sato Kazuya Masu and Tomoyuki Takahashi and Hiroyuki Ueyama and Michihiro Shintani and Takashi Sato and Kazuya Masu}, title = {Critical-Path Clustering for Adaptive Test}, booktitle = {2009 年 電子情報通信学会総合大会}, year = 2009, } @inproceedings{CTT100570735, author = {Tomoyuki Takahashi and Hiroyuki Ueyama and Shiho Hagiwara and Takashi Sato and Kazuya Masu}, title = {論理セル遅延の電圧・プロセスばらつき感度の検討}, booktitle = {電子情報通信学会ソサイエティ大会}, year = 2008, }