@article{CTT100869433,
  author = {Akifumi Maru and Akifumi Matsuda and Satoshi Kuboyama and Mamoru Yoshimoto},
  title = {Simulation-Based Understanding of “Charge-Sharing Phenomenon” Induced by Heavy-Ion Incident on a 65nm Bulk CMOS Memory Circuit},
  journal = {IEICE Transactions on Electronics},
  year = 2022,
}

@inproceedings{CTT100772000,
  author = {丸明史 and 松田晃史 and 吉本護},
  title = {微細半導体プロセスにおける宇宙空間シングルイベント耐性強化技術の検討（２）},
  booktitle = {},
  year = 2018,
}

@inproceedings{CTT100771916,
  author = {丸明史 and 松田晃史 and 吉本護},
  title = {微細半導体プロセスにおけるシングルイベント耐性強化技術の検討},
  booktitle = {},
  year = 2018,
}

@misc{CTT100860906,
  author = {Akifumi Maru},
  title = {Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices},
  year = 2021,
}

@misc{CTT100860907,
  author = {Akifumi Maru},
  title = {Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices},
  year = 2021,
}

@misc{CTT100891757,
  author = {Akifumi Maru},
  title = {Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices},
  year = 2021,
}



@phdthesis{CTT100860906,
  author = {Akifumi Maru},
  title = {Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices},
  school = {東京工業大学},
  year = 2021,
}

@phdthesis{CTT100860907,
  author = {Akifumi Maru},
  title = {Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices},
  school = {東京工業大学},
  year = 2021,
}

@phdthesis{CTT100891757,
  author = {Akifumi Maru},
  title = {Device-Simulation-Based Study of Space Heavy Ions Effects on Semiconductor Material Electronic Devices},
  school = {東京工業大学},
  year = 2021,
}