@article{CTT100592704,
  author = {Takashi Sato and Hiroyuki Ueyama and Noriaki Nakayama and Kazuya Masu},
  title = {Accurate array-based measurement for subthreshold-current of MOS},
  journal = {IEEE Journal of Solid-State Circuits},
  year = 2009,
}

@inproceedings{CTT100604868,
  author = {Michihiro Shintani and Takumi Uezono and Tomoyuki Takahashi and Hiroyuki Ueyama and Takashi Sato and Kasumi Hatayama and Takashi Aikyo and Kazuya Masu},
  title = {An Adaptive Test for Parametric Faults Based on Statistical Timing Information},
  booktitle = {IEEE Asian Test Symposium},
  year = 2009,
}

@inproceedings{CTT100590958,
  author = {新谷 道広 and 高橋 知之 and 植山 寛之 and 上薗 巧 and 佐藤 高史 and 畠山 一実 and 相京 隆 and 益 一哉},
  title = {統計的タイミング情報に基づく適応型テスト},
  booktitle = {2009 年 電子情報通信学会総合大会},
  year = 2009,
}

@inproceedings{CTT100590959,
  author = {上薗 巧 and 高橋 知之 and 植山 寛之 and 新谷 道広 and 佐藤 高史 and 益 一哉},
  title = {適応型テストにおけるクリティカルパスのクラスタリング手法},
  booktitle = {2009 年 電子情報通信学会総合大会},
  year = 2009,
}

@inproceedings{CTT100575055,
  author = {Takashi Sato and Hiroyuki Ueyama and Noriaki Nakayama and Kazuya Masu},
  title = {A MOS transistor array with pico-ampere order precision for accurate characterization of leakage current variation},
  booktitle = {IEEE Asian solid-state circuit conference (ASSCC)},
  year = 2008,
}

@inproceedings{CTT100570706,
  author = {Noriaki Nakayama and Takashi Sato and Hiroyuki Ueyama and Kazuya Masu},
  title = {An efficient extraction of random and systematic gate-length variation through poly-Si resistor measurement},
  booktitle = {Workshop on test structure design for variability characterization},
  year = 2008,
}

@inproceedings{CTT100570735,
  author = {高橋知之 and 植山寛之 and 萩原 汐 and 佐藤高史 and 益 一哉},
  title = {論理セル遅延の電圧・プロセスばらつき感度の検討},
  booktitle = {電子情報通信学会ソサイエティ大会},
  year = 2008,
}

@inproceedings{CTT100570732,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {抵抗測定法によるトランジスタアレイ回路の測定時間短縮化},
  booktitle = {電子情報通信学会ソサイエティ大会},
  year = 2008,
}

@inproceedings{CTT100570748,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {リーク電流測定用トランジスタアレイ回路の測定},
  booktitle = {電子情報通信学会 総合大会},
  year = 2008,
}

@inproceedings{CTT100554527,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {リーク電流測定用トランジスタアレイ回路の測定},
  booktitle = {電子情報通信学会 総合大会},
  year = 2008,
}

@inproceedings{CTT100570723,
  author = {Takashi Sato and Hiroyuki Ueyama and Noriaki Nakayama and Kazuya Masu},
  title = {Determination of optimal polynomial regression function to decompose on-die systematic and random variations},
  booktitle = {ACM/IEEE Asia South Pacific Design Automation Conference (ASPDAC)},
  year = 2008,
}

@inproceedings{CTT100544498,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {閾値電圧の大域ばらつきが回路遅延ばらつきに与える影響},
  booktitle = {},
  year = 2007,
}

@inproceedings{CTT100544509,
  author = {植山寛之 and 佐藤高史 and 中山範明 and 益 一哉},
  title = {大域ばらつきの近似次数が回路遅延ばらつきに与える影響},
  booktitle = {},
  year = 2007,
}