@article{CTT100769657, author = {Takahisa Shiraishi and Kiliha Katayama and Tatsuhiko Yokouchi and Takao Shimizu and Takahiro Oikawa and Osami Sakata and Hiroshi Uchida and Yasuhiko Imai and Takanori Kiguchi and Toyohiko J. Konno and Hiroshi Funakubo}, title = {Effect of the film thickness on the crystal structure and ferroelectric properties of (Hf0.5Zr0.5)O2 thin films deposited on various substrates}, journal = {Materials Science in Semiconductor Processing}, year = 2017, } @article{CTT100702884, author = {Takao Shimizu and Tatsuhiko Yokouchi and Takahiro Oikawa and Takahisa Shiraishi and Takanori Kiguchi and Akihiro Akama and Toyohiko J. Konno and Alexei Gruverman and Hiroshi Funakubo}, title = {Contribution of oxygen vacancies to the ferroelectric behavior of Hf0.5Zr0.5O2 thin films}, journal = {Appl. Phys. Lett.}, year = 2015, } @article{CTT100676148, author = {Takao Shimizu and Tatsuhiko Yokouchi and Takahisa Shiraish and Takahiro Oikawa and P. S. Sankara Rama Krishnan and Hiroshi Funakubo}, title = {Study on the effect of heat treatment conditions on metalorganic-chemical-vapor-deposited ferroelectric Hf0.5Zr0.5O2 thin film on Ir electrode}, journal = {Jpn. J. Appl. Phys.}, year = 2014, } @inproceedings{CTT100721776, author = {Takao Shimizu and Kiriha Katayama and Tatsuhiko Yokouchi and Takahiro Oikawa and Takahisa Shiraishi and Takanori Kiguchi and Toyohiko Konno and Hiroshi Uchida and Hiroshi Funakubo}, title = {Preparation of Fluorite-Structured Ferroelectric Thin Films and Their Characterization}, booktitle = {}, year = 2015, } @inproceedings{CTT100720958, author = {Hiroshi Funakubo and Takahisa Shiraishi and Tatsuhiko Yokouchi and Takahiro Oikawa and Hiroshi Uchida}, title = {Effect of Stress on Ferroelectricity of (Hf0.5Zr0.5)O2 Thin Films}, booktitle = {}, year = 2015, } @inproceedings{CTT100721745, author = {白石貴久 and 片山きりは and 横内達彦 and 清水荘雄 and 及川貴弘 and 内田 寛 and 舟窪 浩 and 木口賢紀 and 今野豊彦}, title = {種々の基板上に作製した (Hf0.5Zr 0.5)O2薄膜の特性}, booktitle = {}, year = 2015, } @inproceedings{CTT100721000, author = {舟窪 浩 and 白石 貴久 and 片山 きりは and 横内 達彦 and 清水 荘雄 and 及川 貴弘 and 内田 寛}, title = {(Hf0.5Zr0.5)O2 薄膜の強誘電性に及ぼす歪の効果}, booktitle = {}, year = 2015, } @inproceedings{CTT100720980, author = {H.Funakubo and T.Shiraishi and T.Shimizu and T.Yokouchi and T.Oikawa and H.Uchida}, title = {Effect of Stress on Ferroelectricity of (Hf0.5Zr0.5)O2 Thin Films}, booktitle = {}, year = 2015, } @inproceedings{CTT100721727, author = {中村奨梧 and 範滄宇 and 白石貴久 and 木口賢紀 and 今野豊彦 and 片山きりは and 清水荘雄 and 横内達彦 and 及川貴弘 and 舟窪浩}, title = {ABF-STEM 法を用いた斜方晶HfO2の分極構造の解析}, booktitle = {}, year = 2015, }