@article{CTT100572306,
  author = {Ogawa, H. and Nakanowatari, A. and Kitagawa, K. and Sugiyama, M. and Naito, T.},
  title = {Simultaneous measurement of film thickness and surface profile of film-covered objects by monochromatic light interferometry.},
  journal = {Transacitons of the Society of Instrument and Control Engineers},
  year = 2009,
}

@article{CTT100582881,
  author = {Naito, T. and Sugiyama, M. and Ogawa, H. and Kitagawa, K. and Suzuki, K.},
  title = {Single-shot interferometry of film-covered objects.},
  journal = {Journal of the Japan Society Precision Engineering},
  year = 2009,
}

@inproceedings{CTT100575833,
  author = {杉山将 and 北川克一 and 鈴木一嘉 and 内藤 卓人 and 小川 英光},
  title = {透明膜で覆われた物体のワンショット干渉計測法：局所モデル適合法による膜厚と表面形状の同時測定},
  booktitle = {精密工学会秋季大会学術講演会講演論文集},
  year = 2008,
}