@inproceedings{CTT100417452,
  author = {Shun-Ishiro Ohmi and Makoto Yoshihara and Takeo Okamoto and EISUKE TOKUMITSU and HIROSHI ISHIWARA},
  title = {Electrical Properties of Ferroelectric Gate HEMT Structures (共著)},
  booktitle = {Japanese Journal of Applied Physics},
  year = 1996,
}