@article{CTT100546122,
  author = {Toshihiro Ishihara and Isao Ohkubo and Kenta Tsubouchi and Hiroshi Kumigashira and Joshi U.S. and Y. Matsumoto and H. Koinuma and Masaharu Oshima},
  title = {Electrode dependence and film resistivity effect in the electric-field-induced resistance-switching phenomena in epitaxial NiO films},
  journal = {Mater.Sci.Eng.B},
  year = 2008,
}

@article{CTT100546144,
  author = {K. Tsubouchi and I. Ohkubo and Naoyuki Harada and H. Kumigashira and Y. Matsumoto and T. Ohnishi and M. Lippma and H. Koinuma and M. Oshima},
  title = {Modification of reflection high-energy electron diffraction system for in situ monitoring of oxide epitaxy at high oxygen pressure},
  journal = {Mater.Sci.Eng.B},
  year = 2008,
}

@inproceedings{CTT100546138,
  author = {Isao Ohkubo and K. Tsubouchi and Naoyuki Harada and H. Kumigashira and Kenji Itaka and Y. Matsumoto and Tsuyoshi Ohnishi and Mikk Lippma and H. Koinuma and M. Oshima},
  title = {Field-induced resistance switching at metal/perovskite manganese oxide interface},
  booktitle = {Mater.Sci.Eng.B},
  year = 2008,
}