@inproceedings{CTT100607559,
  author = {Takumi Uezono and Tomoyuki Takahashi and Michihiro Shintani and Kazumi Hatayama and Kazuya Masu and Hiroyuki Ochi and Takashi Sato},
  title = {Scan Based Process Parameter Estimation Through Path-Delay Inequalities},
  booktitle = {IEEE International Symposium on Circuits and Systems (ISCAS 2010)},
  year = 2010,
}