国際会議発表 (査読有り)

• Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato. Scan Based Process Parameter Estimation Through Path-Delay Inequalities, IEEE International Symposium on Circuits and Systems (ISCAS 2010), IEEE International Symposium on Circuits and Systems (ISCAS 2010), IEEE International Symposium on Circuits and Systems (ISCAS 2010), June 2010.  公式リンク  
  

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