@article{CTT100609138,
  author = {M. Ohtani and T. Fukumura and M. Kawasaki and K. Omote and T. Kikuchi and J. Harada and A. Ohtomo and M. Lippmaa and T. Ohnishi and D. Komiyama and R. Takahashi and Y. Matsumoto and H. Koinuma},
  title = {Concurrent x-ray diffractometer for high throughput structural diagnosis of epitaxial thin films},
  journal = {Applied Physics Letters},
  year = 2001,
}

@article{CTT100609032,
  author = {T. Ohnishi and D. Komiyama and T. Koida and S. Ohashi and C. Stauter and H. Koinuma and A. Ohtomo and M. Lippmaa and N. Nakagawa and M. Kawasaki and T. Kikuchi and K. Omote},
  title = {Parallel integration and characterization of nanoscaled epitaxial lattices by concurrent molecular layer epitaxy and diffractometry},
  journal = {Applied Physics Letters},
  year = 2001,
}

@inproceedings{CTT100609782,
  author = {M. Ohtani and T. Fukumura and A. Ohtomo and T. Kikuchi and K. Omote and H. Koinuma and M. Kawasaki},
  title = {High-throughput x-ray diffractometer for combinatorial epitaxial thin films},
  booktitle = {Materials Research Society Symposium Proceedings (edited by I. Takeuchi, J. M. Newsam, L. T. Wille, H. Koinuma and E. J. Amis)},
  year = 2002,
}