@article{CTT100609138,
  author = {M. Ohtani and T. Fukumura and M. Kawasaki and K. Omote and T. Kikuchi and J. Harada and A. Ohtomo and M. Lippmaa and T. Ohnishi and D. Komiyama and R. Takahashi and Y. Matsumoto and H. Koinuma},
  title = {Concurrent x-ray diffractometer for high throughput structural diagnosis of epitaxial thin films},
  journal = {Applied Physics Letters},
  year = 2001,
}