@inproceedings{CTT100659713,
  author = {T. Oishi and K. Hayashi and Y. Yamaguchi and H. Otsuka and K.  Yamanaka and M. Nakayama and Y. Miyamoto},
  title = {Mechanism study of gate leakage current for AlGaN/GaN HEMT structure under high reverse bias by TSB model and TCAD simulation},
  booktitle = {},
  year = 2012,
}