@article{CTT100823960,
  author = {T. Tange and T. Matsukata and T. Sannomiya},
  title = {Mechanism of trench defect formation in InGaN/GaN single quantum well grown on single-crystal GaN substrate},
  journal = {Applied Physics Express},
  year = 2020,
}

@inproceedings{CTT100845154,
  author = {Takashi Tange and Taeko Matsukata and Takumi Sannomiya},
  title = {Structural and Luminescence Characteristics of Trench Defects in Red-emitting InGaN/GaN on Single-crystal GaN Substrate},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100843748,
  author = {Takashi Tange and Taeko Matsukata and Takumi Sannomiya},
  title = {Structural and Luminescence Characteristics of Trench Defects in Red-emitting InGaN/GaN on Single-crystal GaN Substrate},
  booktitle = {},
  year = 2020,
}

@inproceedings{CTT100821612,
  author = {丹下貴志 and 松方 妙子 and 三宮 工},
  title = {赤色発光InGaN/GaN SQWにおけるトレンチ欠陥の構造および発光評価},
  booktitle = {},
  year = 2020,
}

@inproceedings{CTT100808642,
  author = {丹下 貴志 and 三宮工},
  title = {STEM-CLスペクトルイメージングによるInGaN/GaN構造の環状欠陥評価},
  booktitle = {},
  year = 2019,
}

@misc{CTT100887698,
  author = {丹下貴志},
  title = {収差補正走査透過電子顕微鏡解析を用いたInGaN量子井戸の微細構造と発光効率低下に関する研究},
  year = 2021,
}

@misc{CTT100843749,
  author = {丹下 貴志},
  title = {収差補正走査透過電子顕微鏡解析を用いたInGaN量子井戸の微細構造と発光効率低下に関する研究},
  year = 2021,
}

@misc{CTT100843750,
  author = {丹下 貴志},
  title = {収差補正走査透過電子顕微鏡解析を用いたInGaN量子井戸の微細構造と発光効率低下に関する研究},
  year = 2021,
}



@phdthesis{CTT100887698,
  author = {丹下貴志},
  title = {収差補正走査透過電子顕微鏡解析を用いたInGaN量子井戸の微細構造と発光効率低下に関する研究},
  school = {東京工業大学},
  year = 2021,
}

@phdthesis{CTT100843749,
  author = {丹下 貴志},
  title = {収差補正走査透過電子顕微鏡解析を用いたInGaN量子井戸の微細構造と発光効率低下に関する研究},
  school = {東京工業大学},
  year = 2021,
}

@phdthesis{CTT100843750,
  author = {丹下 貴志},
  title = {収差補正走査透過電子顕微鏡解析を用いたInGaN量子井戸の微細構造と発光効率低下に関する研究},
  school = {東京工業大学},
  year = 2021,
}