論文

• Chiemi Ishiyama, Toshikazu Tasaki, Tso-Fu Mark Chang, Masato Sone. Effects of Specimen Dimensions on Adhesive Shear Strength between a Microsized SU-8 Column and Silicon Substrate, Japan Journal of Applied Physics, Vol. 51, No. 6, Page 06FL19, June 2012.
• Tso-Fu Mark Chang, Toshikazu Tasaki, Chiemi Ishiyama, Masato Sone. Defect-Free Nickel Micro-pillars Fabricated at a High Current Density by Application of Supercritical Carbon Dioxide Emulsion, Industrial & Engineering Chemistry Research, ACS Publications, Vol. 50, No. 13, pp. 8080–8085, July 2011.
• Tso-Fu Mark Chang, Toshikazu Tasaki, CHIEMI ISHIYAMA, Masato Sone. Void-free nickel pattern electroplated with supercritical carbon dioxide emulsions, Microelectronics Engineering, Elsevier, Vol. 88, pp. 2225-2228, June 2011.
• Toshikazu Tasaki, Tso-Fu Mark Chang, Chiemi Ishiyama, Masato Sone. Study on delamination mechanism of SU-8 micropillars on a Si-substrate under bend loading by Weibull analysis, Microelectronics Engineering, Elsevier, Vol. 88, pp. 2132-2134, June 2011.
• Nobuyuki Yoshida, Toshikazu Tasaki, Tso-Fu Mark Chang, Akinobu Shibata, CHIEMI ISHIYAMA, Masato Sone. Pd-Ni-P metallic glass pattern with controllable microstructure fabricated by electroless alloy plating, Microelectronics Engineering., Elsevier, Vol. 88, pp. 2401-2404, June 2011.

国際会議発表 (査読有り)

• Nobuyuki Yoshida, Toshikazu Tasaki, Mark Chang, Akinobu Shibata, CHIEMI ISHIYAMA, Masato Sone. Pd-Ni-P metallic glass pattern with controllable microstructure fabricated by electroless alloy plating, MNE 2010, 36th International Conference on Micro& Nano Engineering, MNE 2010, pp. P-MEMS-12, Sept. 2010.
• Tso-Fu Mark Chang, Toshikazu Tasaki, CHIEMI ISHIYAMA, Masato Sone. Void-free nickel pattern electroplated with supercritical carbon dioxide emulsions, MNE 2010, 36th International Conference on Micro& Nano Engineering, MNE 2010, p. P-MEMS-9, Sept. 2010.
• Toshikazu Tasaki, Tso-Fu Mark Chang, CHIEMI ISHIYAMA, Masato Sone. Study on delamination mechanism of SU-8 micropillars on a Si-substrate, MNE 2010, 36th International Conference on Micro& Nano Engineering, MNE 2010, p. P-LITH-6, Sept. 2010.

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