@article{CTT100434637,
  author = {H.Hongo and Y.Miyamoto and M.Suhara and K.Furuya},
  title = {Hot electron interference by 40nm-pitch double slit buried in semiconductor},
  journal = {Microelectronic Engineering},
  year = 1997,
}

@article{CTT100434638,
  author = {H.Hongo and H.Tanaka and Y.Miyamoto and T.Otake and J.Yoshinaga and K.Furuya},
  title = {Electrical properties of 100nm pitch Cr/Au fine electrodes with 40nm width on GaInAs toward hot electron interference/diffraction devices},
  journal = {Microelectronic Engineering},
  year = 1997,
}

@article{CTT100434639,
  author = {YASUYUKI MIYAMOTO},
  title = {High-temperature estimation of phase coherent length of hot electron using GaInAs/InP triple-barrier resonant tunneling diodes grown by OMVPE},
  journal = {Jpn.J.Appl.Phys.},
  year = 1997,
}

@article{CTT100434640,
  author = {M.Suhara and C.Nagao and H.Honji and Y.Miyamoto and K.Furuya and R.Takemura},
  title = {Atomically flat OMVPE growth of GaInAs and InP observed by AFM for level narrowing in resonant tunneling diodes},
  journal = {J.Cryst.Growth},
  year = 1997,
}

@article{CTT100434641,
  author = {T.Oobo and R.Takemura and M.Suhara and Y.Miyamoto and K.Furuya},
  title = {High Peak to Valley Current Ratio GaInAs/GaInP Resonant Tunneling Diodes},
  journal = {Jpn.J.Appl.Phys.},
  year = 1997,
}

@article{CTT100442444,
  author = {H.Hongo and Y.Miyamoto and M.Suhara and K.Furuya},
  title = {A 40nm pitch doble slit experiment of hot electrons in a semiconductor under a magnetic field},
  journal = {Applied Physics Letter},
  year = 1997,
}

@article{CTT100442445,
  author = {J.M.M.Rios and L.M.Lurardi and S.Chandrasekhar and Y.Miyamoto},
  title = {A self-consistent method for complete small-signal parameter extraction of InP-based heterojunction bipolar transistors(HBTs)},
  journal = {IEEE Transaction of Microwave Theory and Technigue},
  year = 1997,
}

@article{CTT100442446,
  author = {H.Hongo and Y.Miyamoto and M.Gault and K.Furuya},
  title = {Influence of finite energy width in electron distribution to an experiment of hot electron donble-slit eyperiment},
  journal = {J. Appl. Phys.},
  year = 1997,
}