@article{CTT100592704,
  author = {Takashi Sato and Hiroyuki Ueyama and Noriaki Nakayama and Kazuya Masu},
  title = {Accurate array-based measurement for subthreshold-current of MOS},
  journal = {IEEE Journal of Solid-State Circuits},
  year = 2009,
}

@inproceedings{CTT100592695,
  author = {Tomoyuki Takahashi and Takumi Uezono and Michihiro Shintani and Kazuya Masu and Takashi Sato},
  title = {On-die parameter extraction from path-delay measurements},
  booktitle = {2009 IEEE Asian Solid-State Circuits Conference},
  year = 2009,
}

@inproceedings{CTT100604868,
  author = {Michihiro Shintani and Takumi Uezono and Tomoyuki Takahashi and Hiroyuki Ueyama and Takashi Sato and Kasumi Hatayama and Takashi Aikyo and Kazuya Masu},
  title = {An Adaptive Test for Parametric Faults Based on Statistical Timing Information},
  booktitle = {IEEE Asian Test Symposium},
  year = 2009,
}

@inproceedings{CTT100604892,
  author = {Tomoyuki Takahashi and takumi uezono and Hiroyuki Ochi and Kazuya Masu and Takashi Sato},
  title = {パス遅延測定によるチップ特性の推定手法},
  booktitle = {DAシンポジウム},
  year = 2009,
}