@misc{CTT100733876,
  author = {Eiichi Sasaki and Yuutarou Umekawa and Yusuke Kobayashi and Hisatada SUGANUMA},
  title = {構造物変位解析装置、および構造物変位解析プログラム},
  howpublished = {RegisteredPatent},
  year = 2019,
  month  = {},
  note   = {特願2015-024381(2015/02/10), 特開2016-148549(2016/08/18), 特許第6473008号(2019/02/01)}
}