@inproceedings{CTT100880813,
  author = {Yuta Oshima and Motoki Ando and Kenji Hirakawa and Masayuki Iwase and Munehiro Ogasawara and Takashi Yoda and Noboru Ishihara and Hiroyuki Ito},
  title = {Development of dynamic deterioration model of MOSFET under TID effect},
  booktitle = {},
  year = 2019,
}

@inproceedings{CTT100880818,
  author = {Motoki Ando and Yuta Oshima and Kenji Hirakawa and Masayuki Iwase and Munehiro Ogasawara and Takashi Yoda and Noboru Ishihara and Hiroyuki Ito},
  title = {Evaluation of TID effect in CMOS logic circuits},
  booktitle = {},
  year = 2019,
}

@inproceedings{CTT100880831,
  author = {Takumi Tomizawa and Kento Kawakami and Teruo Sakurai and Akira Kusaba and Naoya Okamoto and Katsunori Yoshimatsu and Yoshiaki Daigo and Ichiro Mizushima and Takashi Yoda and Yoshihiro Kangawa and Koichi Kakimoto and Kenji Shiraishi},
  title = {Simulation of a GaN MOVPE Process in a Vertical Crystal Growth Apparatus},
  booktitle = {},
  year = 2019,
}