@article{CTT100842131,
  author = {T. Murooka and J. Yaita and T. Makino and M. Ogura and H. Kato and S. Yamasaki and M. Natal and S. E. Saddow and T. Iwasaki and M. Hatano},
  title = {Characterization of Schottky Barrier Diodes on Heteroepitaxial Diamond on 3C-SiC/Si Substrates},
  journal = {IEEE Transactions on Electron Devices},
  year = 2019,
}

@article{CTT100843885,
  author = {Takuya Murooka and Hitoshi Umezawa and Toshiharu Makino and Masahiko Ogura and Hiromitsu Kato and Satoshi Yamasaki and Takayuki Iwasaki and Julien Pernot and Mutsuko Hatano},
  title = {Determination of Current Leakage Sites in Diamond p–n Junction},
  journal = {Physica Status Solidi A 2019},
  year = 2019,
}

@inproceedings{CTT100843848,
  author = {Takuya Murooka and Masafumi Shiigai and Yang Bang and Toshiharu Makino and Hiromitsu Kato and Masahiko Ogura and Satoshi Yamasaki and Mutsuko Hatano and Takayuki Iwasaki},
  title = {Photoelectrical Detection of NV Centers Utilizing a pin Diode},
  booktitle = {},
  year = 2019,
}

@inproceedings{CTT100843851,
  author = {Bang Yang and Motoki Nakamura and Takuya Murooka and Toshiharu Makino and Hiromitsu Kato and Masahiko Ogura and Satoshi Yamasaki and Mutsuko Hatano and Takayuki Iwasaki},
  title = {Nanoscale Sensing of Vector Electric Field in Diamond pin Diode},
  booktitle = {},
  year = 2019,
}

@inproceedings{CTT100843841,
  author = {Takayuki Iwasaki and Takuya Murooka and Bang Yang and Masafumi Shiigai and Motoki Nakamura and Hiromitsu Kato and Toshiharu Makino and Masahiko Ogura and Satoshi Yamasaki and Mutsuko Hatano},
  title = {NV Quantum Sensors in Diamond Electronic Devices},
  booktitle = {},
  year = 2019,
}

@inproceedings{CTT100843847,
  author = {Takuya Murooka and 楊 棒 and Masafumi Shiigai and 牧野 俊晴 and 加藤 宙光 and 小倉 政彦 and 山崎 聡 and Mutsuko Hatano and Takayuki Iwasaki},
  title = {ダイヤモンドNVセンターの電気的読み出しに向けたpin構造による光電流の検出},
  booktitle = {},
  year = 2019,
}

@inproceedings{CTT100799641,
  author = {Takuya Murooka and 牧野 俊晴 and 小倉 政彦 and 加藤 宙光 and 山崎 聡 and Takayuki Iwasaki and Julien Pernot and Mutsuko Hatano},
  title = {BICを用いたダイヤモンドpn+接合におけるリーク電流の評価},
  booktitle = {},
  year = 2019,
}

@inproceedings{CTT100799633,
  author = {T. Murooka and T. Makino and M. Ogura and H. Kato and S. Yamasaki and T. Iwasaki and J. Pernot and M. Hatano},
  title = {Investigation of leakage current sites in diamond pn+ junction with electron-beam-induced current technique},
  booktitle = {},
  year = 2019,
}

@inproceedings{CTT100843857,
  author = {Takuya Murooka and Hitoshi Umezawa and Toshiharu Makino and Masahiko Ogura and Hiromitsu Kato and Satoshi Yamasaki and Takayuki Iwasaki and Julien Pernot and Mutsuko Hatano},
  title = {Investigation of Leakage Current Sites in pn junction for Charge-state Control of NV Centers in Diamond},
  booktitle = {},
  year = 2019,
}

@misc{CTT100865153,
  author = {Mutsuko Hatano and Takayuki Iwasaki and Nobuhiko Nishiyama and Yuta Masuyama and Takuya Murooka},
  title = {集積回路及びセンサシステム},
  howpublished = {PublishedPatent},
  year = 2021,
  month  = {},
  note   = {特願2020-546233(2019/09/13), 再表2020/054860(2021/09/16)}
}