@article{CTT100711247,
  author = {Zhengyu Xu and kouichi usami and Tomohiro Noguchi and Yukio Kawano and Teruyuki Ohashi and Takahisa Tanaka and Tsunaki Takahashi and Shunri Oda and Ken Uchida},
  title = {Experimental Study on Deformation Potential (<i>D<sub>ac</sub></i>) in MOSFETs: Demonstration of Increased <i>D<sub>ac</sub></i> at MOS Interfaces and Its Impact on Electron Mobility},
  journal = {IEEE Journal of the Electron},
  year = 2016,
}

@inproceedings{CTT100711241,
  author = {野口 智弘 and Simanullang Marolop and 宇佐美 浩一 and 小寺 哲夫 and 小田 俊理},
  title = {Ge/Si コアシェル ナノワイヤの電気伝導率における径依存性},
  booktitle = {},
  year = 2016,
}

@inproceedings{CTT100711242,
  author = {高木 寛之 and 野口 智弘 and Simanullang Marolop and 宇佐美 浩一 and 小寺 哲夫 and 小田 俊理},
  title = {低温下におけるGe/Si コアシェルナノワイヤの電気特性評価},
  booktitle = {},
  year = 2016,
}