@article{CTT100862413,
  author = {Fumihiro Wakai and Gaku Okuma and Robert Mücke and Olivier Guillon},
  title = {Modelling of elimination of strength-limiting defects by pressure-assisted sintering at low stress levels},
  journal = {Journal of the European Ceramic Society},
  year = 2021,
}

@article{CTT100854611,
  author = {Gaku Okuma and Ryo Miyaki and Kan Shinobe and Anna Sciazko and Takaaki Shimura and Zilin Yan and Shotaro Hara and Toshinori Ogashiwa and Naoki Shikazono and Fumihiro Wakai},
  title = {Anisotropic microstructural evolution and coarsening in free sintering and constrained sintering of metal film by using FIB-SEM tomography},
  journal = {Acta Materialia},
  year = 2021,
}

@article{CTT100847088,
  author = {Kei Maeda and Kosho Akatsuka and Gaku Okuma and Atsuo Yasumori},
  title = {Mechanical Properties of CaO–Al2O3–SiO2 Glass-Ceramics Precipitating Hexagonal CaAl2Si2O8 Crystals},
  journal = {Crystals},
  year = 2021,
}

@article{CTT100842285,
  author = {Gaku Okuma and Naoya Saito and Kotaro Mizuno and Yoshiki Iwazaki and Hiroshi Kishi and Akihisa Takeuchi and Masayuki Uesugi and Fumihiro Wakai},
  title = {Microstructural evolution of electrodes in sintering of multi-layer ceramic capacitors (MLCC) observed by synchrotron X-ray nano-CT},
  journal = {Acta Materialia},
  year = 2021,
}

@inproceedings{CTT100863424,
  author = {大熊 学},
  title = {高信頼性材料設計のための放射光X線CT 3次元マルチスケール解析},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100863922,
  author = {Gaku Okuma},
  title = {Reliability analysis of electronic device by using synchrotron X-ray nano-CT : Microstructural evolution of electrodes of MLCC},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100862409,
  author = {大熊 学 and 若井 史博},
  title = {金属膜の自由焼結および拘束焼結中の異方的な微細構造進展と粗大化プロセスのFIB-SEMトモグラフィー解析},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100862415,
  author = {皆川 開 and 大熊 学 and 田中 諭 and 垣澤 英樹 and 若井 史博 and 井上 遼},
  title = {熱間等方加圧（HIP）による欠陥収縮過程の放射光X線CT観察},
  booktitle = {一般社団法人 日本機械学会},
  year = 2021,
}

@inproceedings{CTT100862408,
  author = {大熊 学 and 斎藤 直哉 and 水野 高太郎 and 若井 史博},
  title = {放射光X線ナノCTによる電子デバイスの信頼性解析： MLCCの電極構造形成プロセス},
  booktitle = {一般社団法人 日本機械学会},
  year = 2021,
}

@inproceedings{CTT100862412,
  author = {大熊 学 and 若井 史博},
  title = {放射光X線CTによる電子デバイスの信頼性解析:MLCCの電極構造形成プロセス},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100854615,
  author = {大熊 学},
  title = {放射光X線マルチスケールCTで見る焼結プロセスにおける欠陥形成と強度信頼性},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100854613,
  author = {大熊 学 and 若井 史博},
  title = {高信頼性材料設計のための放射光X線CT3次元ナノスケール解析},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100862410,
  author = {大熊 学},
  title = {高信頼性材料設計のための放射光X線CT3次元ナノスケール解析},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100862411,
  author = {大熊 学 and 斎藤 直哉 and 水野 高太郎 and 若井 史博},
  title = {放射光X線ナノCTによる電子デバイスの信頼性解析：MLCCの電極構造形成プロセス},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100854612,
  author = {Gaku Okuma and Naoya Saito and Kotaro Mizuno and Fumihiro Wakai},
  title = {Reliability analysis of electronic device by using synchrotron X-ray nano-CT : Microstructural evolution of electrodes of MLCC},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100847084,
  author = {大熊 学 and 齋藤 直哉 and 若井 史博 and 水野 高太郎},
  title = {結像型X線ナノCTによる電子デバイスの信頼性解析:MLCCの電極構造形成プロセス},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100847083,
  author = {遠藤 順也 and 大熊 学 and 若井 史博},
  title = {加圧焼結によるアルミナ焼結体中の内部欠陥収縮過程の放射光X線CT観察},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100847082,
  author = {斉藤 直哉 and 大熊 学 and 水野 高太郎 and 岩崎 誉志紀 and 岸 弘志 and 竹内 晃久 and 上杉 健太朗 and 若井 史博},
  title = {積層セラミックスコンデンサー(MLCC)焼成過程における電極微構造変化の放射光X線ナノCT観察},
  booktitle = {},
  year = 2021,
}

@inproceedings{CTT100847081,
  author = {大熊 学 and 斉藤 直哉 and 若井 史博 and 竹内 晃久 and 上杉 健太朗 and 水野 高太郎 and 岩崎 誉志紀 and 岸 弘志},
  title = {放射光X線ナノCTによる電子デバイスの信頼性解析~MLCCの電極構造形成プロセス~},
  booktitle = {},
  year = 2021,
}

@misc{CTT100842350,
  author = {大熊学 and 斉藤直哉 and 水野高太郎 and 若井史博},
  title = {放射光X線ナノCTによる電子デバイスの信頼性解析 ー MLCCの電極構造形成プロセスー},
  year = 2021,
}