@article{CTT100874137, author = {Munehiro Ogasawara and Ryoichiro Yoshida and Yuta Oshima and Motoki Ando and Arisa Kimura and Kenji Hirakawa and Masayuki Iwase and Shinsuke Nabeya and Takashi Yoda and Noboru Ishihara and Hiroyuki Ito}, title = {Dependence of total ionizing dose effect of nMOS transistors on the on/off duty ratio of a gate voltage}, journal = {Japanese Journal of Applied Physics}, year = 2021, } @article{CTT100874327, author = {Kenta Chokawa and Yoshiaki Daigo and Ichiro Mizushima and Takashi Yoda and Kenji Shiraishi}, title = {First-principles and thermodynamic analysis for gas phase reactions and structures of the SiC(0001) surface under conventional CVD and Halide CVD environments}, journal = {Japanese Journal of Applied Physics}, year = 2021, } @inproceedings{CTT100877153, author = {Mitsuki Nishizawa and T. Hoshii and H. Wakabayashi and K. Tsutsui and I. Mizushima and T. Yoda and K. Kakushima}, title = {Introduction of surface field-plate for accurate minority carrier lifetime estimation of 4H-SiC epitaxial layer}, booktitle = {}, year = 2021, } @inproceedings{CTT100875832, author = {小森 勇太 and 木村 安希 and 星井 拓也 and 宮野 清孝 and 津久井 雅之 and 水島 一郎 and 依田 孝 and 角嶋 邦之 and 若林 整 and 筒井 一生}, title = {InAlN/AlN/GaN構造におけるキャリア散乱要因のAlN層厚依存性}, booktitle = {}, year = 2021, } @inproceedings{CTT100885803, author = {木村有佐 and 吉田僚一郎 and 安藤幹 and 大島佑太 and 鍋屋信介 and 平川顕二 and 岩瀬正幸 and 小笠原宗博 and 依田孝 and 石原昇 and 伊藤浩之}, title = {P型とN型のFETサイズ比が異なるCMOS論理回路へのγ線照射の影響}, booktitle = {}, year = 2021, } @inproceedings{CTT100875829, author = {小森 勇太 and 星井 拓也 and 宮野 清孝 and 津久井 雅之 and 水島 一郎 and 依田 孝 and 角嶋 邦之 and 若林 整 and 筒井 一生}, title = {InAlN/AlN/GaN構造中2DEGにおける移動度のキャリア濃度依存性}, booktitle = {}, year = 2021, } @inproceedings{CTT100884747, author = {吉田僚一郎 and 木村有佐 and 安藤幹 and 大島佑太 and 鍋屋信介 and 平川顕二 and 岩瀬正幸 and 石原昇 and 小笠原宗博 and 依田孝 and 伊藤浩之}, title = {ELT(Enclosed Layout Transistor)による耐放射線CMOS集積回路の設計}, booktitle = {情報処理学会シンポジウムシリーズ}, year = 2021, } @inproceedings{CTT100885802, author = {木村有佐 and 吉田僚一郎 and 安藤幹 and 大島佑太 and 鍋屋信介 and 平川顕二 and 岩瀬正幸 and 小笠原宗博 and 依田孝 and 石原昇 and 伊藤浩之}, title = {CMOSリング発振回路へのγ線照射の影響とその要因解析}, booktitle = {}, year = 2021, } @inproceedings{CTT100865291, author = {Takashi Yoda and Noboru Ishihara and Yuta Oshima and Motoki Ando and Ryoichiro Yoshida and Shinsuke Nabeya and Kenji Hirakawa and Masayuki Iwase and Munehiro Ogasawara and Hiroyuki Ito}, title = {CMOS 2-D Array Data Transfer Circuit Design and Evaluation for Use in A Radiation Environment}, booktitle = {}, year = 2021, } @inproceedings{CTT100885801, author = {木村有佐 and 吉田僚一郎 and 安藤幹 and 大島佑太 and 鍋屋信介 and 平川顕二 and 岩瀬正幸 and 小笠原宗博 and 依田孝 and 石原昇 and 伊藤浩之}, title = {リング発振回路におけるELTの耐放射線評価}, booktitle = {}, year = 2021, }