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Title
Japanese: 
English:S-parameter-based modal decomposition of multiconductor transmission lines and its application to de-embedding 
Author
Japanese: 天川 修平, 山長 功, 伊藤 浩之, 佐藤 高史, 石原 昇, 益 一哉.  
English: S. Amakawa, K. Yamanaga, H. Ito, T. Sato, N. Ishihara, K. Masu.  
Language English 
Journal/Book name
Japanese: 
English:International Conference on Microelectronic Test Structures (ICMTS) 
Volume, Number, Page         pp. 177-180
Published date Apr. 2009 
Publisher
Japanese: 
English: 
Conference name
Japanese: 
English:International Conference on Microelectronic Test Structures (ICMTS) 
Conference site
Japanese: 
English:Oxnard, California, USA 
File
DOI https://doi.org/10.1109/ICMTS.2009.4814635

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