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Publication Information
Title
Japanese:
English:
S-parameter-based modal decomposition of multiconductor transmission lines and its application to de-embedding
Author
Japanese:
天川 修平
,
山長 功
,
伊藤 浩之
,
佐藤 高史
,
石原 昇
,
益 一哉
.
English:
S. Amakawa
,
K. Yamanaga
,
H. Ito
,
T. Sato
,
N. Ishihara
,
K. Masu
.
Language
English
Journal/Book name
Japanese:
English:
International Conference on Microelectronic Test Structures (ICMTS)
Volume, Number, Page
pp. 177-180
Published date
Apr. 2009
Publisher
Japanese:
English:
Conference name
Japanese:
English:
International Conference on Microelectronic Test Structures (ICMTS)
Conference site
Japanese:
English:
Oxnard, California, USA
File
DOI
https://doi.org/10.1109/ICMTS.2009.4814635
©2007
Tokyo Institute of Technology All rights reserved.