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Title
Japanese:イオンビーム照射によりアモルファス化したSi表面のXRR測定 
English: 
Author
Japanese: 佐藤美那, 遠西美重, 松谷晃宏.  
English: Mina Sato, Mie Tohnishi, Akihiro Matsutani.  
Language Japanese 
Journal/Book name
Japanese: 
English: 
Volume, Number, Page        
Published date Mar. 2024 
Publisher
Japanese: 
English: 
Conference name
Japanese:第71回応用物理学会春季学術講演会 
English: 
Conference site
Japanese: 
English: 

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