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Publication Information
Title
Japanese:
イオンビーム照射によりアモルファス化したSi表面のXRR測定
English:
Author
Japanese:
佐藤美那
,
遠西美重
,
松谷晃宏
.
English:
Mina Sato
,
Mie Tohnishi
,
Akihiro Matsutani
.
Language
Japanese
Journal/Book name
Japanese:
English:
Volume, Number, Page
Published date
Mar. 2024
Publisher
Japanese:
English:
Conference name
Japanese:
第71回応用物理学会春季学術講演会
English:
Conference site
Japanese:
English:
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Institute of Science Tokyo All rights reserved.