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研究業績一覧 (1件)
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論文
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Kuniyuki KAKUSHIMA,
K. Okamoto,
M. Adachi,
Kiichi Tachi,
Ahmet Parhat,
KAZUO TSUTSUI,
Nobuyuki Sugii,
takeo hattori,
HIROSHI IWAI.
Origin of flat band voltage shift in HfO2 gate dielectric with La2O3 insertion,
SOLID-STATE ELECTRONICS,
Vol. 52,
pp. 1280-1284,
2008.
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