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研究業績一覧 (1件)
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論文
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Kiichi Tachi,
S. Barraud,
Kuniyuki KAKUSHIMA,
HIROSHI IWAI,
S. Cristoloveanu,
T. Ernst.
Comparison of low-temperature electrical characteristics of gate-all-around nanowire FETs, Fin FETs and fully-depleted SOI FETs,
Microelectronics Reliability,
Vol. 51,
pp. 885-888,
May 2011.
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