|
研究業績一覧 (1件)
- 2024
- 2023
- 2022
- 2021
- 2020
- 全件表示
論文
-
Kiichi Tachi,
S. Barraud,
Kuniyuki KAKUSHIMA,
HIROSHI IWAI,
S. Cristoloveanu,
T. Ernst.
Comparison of low-temperature electrical characteristics of gate-all-around nanowire FETs, Fin FETs and fully-depleted SOI FETs,
Microelectronics Reliability,
Vol. 51,
pp. 885-888,
May 2011.
[ BibTeX 形式で保存 ]
[ 論文・著書をCSV形式で保存
]
[ 特許をCSV形式で保存
]
|