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研究業績一覧 (1件)
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国際会議発表 (査読有り)
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Yi-Lun Yang,
Jia-Ling Liu,
Guan Wei Chen,
Shoichi Kodama,
Kyosuke Kobinata,
Kuan-Neng Chen,
Hiroyuki Ito,
Kim Youngsuk,
Takayuki Ohba.
Highly Reliable Four-Point Bending Test Using Stealth Dicing Method for Adhesion Evaluation,
International Conference on Electronics Packaging,
pp. 28-31,
Apr. 2019.
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