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Title
光学ひずみゲージ、光学的ひずみ測定装置及び光学的ひずみ測定方法 
Author
KENJI AMAYA, YUKI ONISHI.  
Kind
Patent 
Status
Registered 
Applicant
国立大学法人東京工業大学.  
Filing Date
2010/02/09
Application Number
特願2010-026405
Unexamined Application Date
2011/08/25
Publication Number
特開2011-163896
Registration Date
2013/11/15
Registration Number
特許第5408590号

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