Japanese
Home
Search
Horizontal Search
Publication Search
( Advanced Search )
Patent Search
( Advanced Search )
Research Highlight Search
( Advanced Search )
Researcher Search
Search by Organization
Support
FAQ
T2R2 User Registration
Doctoral thesis registration
Support/Contact
About T2R2
What's T2R2?
Operation Guidance
Leaflets
About file disclosure
Related Links
Science Tokyo
STAR Search
NII IR Program
Home
>
Help
Patent Information
Title
液晶の評価方法及び液晶パネルの評価方法
Author
Martin Vacha
,
Shuzo Hirata
,
Seonik Lee
,
Koji Noda
.
Kind
Patent
Status
Registered
Applicant
国立大学法人東京工業大学, DIC株式会社.
Filing Date
2013/09/04
Application Number
特願2013-183461
Unexamined Application Date
2015/03/16
Publication Number
特開2015-049231
Registration Date
2017/09/29
Registration Number
特許第6213075号
©2007
Institute of Science Tokyo All rights reserved.