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Patent Information


Title
ナノ粒子組成分析選別装置及びナノ粒子組成分析選別方法 
Author
Kiyotaka Aikawa.  
Kind
Patent 
Status
Published 
Applicant
国立大学法人東京工業大学.  
Filing Date
2015/10/15
Application Number
特願2015-203446
Unexamined Application Date
2017/04/20
Publication Number
特開2017-075857

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