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Patent Information
Title
試料の測定装置、測定方法およびプログラム
Author
Tomohiro Amemiya
,
Sho Okada
.
Kind
Patent
Status
Registered
Applicant
国立大学法人東京工業大学, 株式会社 東京インスツルメンツ.
Filing Date
2019/12/02
Application Number
特願2019-217786
Unexamined Application Date
2021/06/10
Publication Number
特開2021-089146
Registration Date
2023/07/24
Registration Number
特許第7318868号
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