High-Resolution Electron Microscopy of SiC/Al<sub>4</sub>C<sub>3</sub> Interface

Publication Information

Title

Japanese:
English:	High-Resolution Electron Microscopy of SiC/Al₄C₃ Interface

Author

Japanese:	T. Yano, S. Kato, T. Iseki.
English:	T. Yano, S. Kato, T. Iseki.

Language

English

Journal/Book name

Japanese:
English:	J. Am. Ceramic. Society

Volume, Number, Page

Vol. 75 No. 3 pp. 580-586

Published date

1992

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: