High-Resolution Electron Microscopy of Neutron-Irradiation-Indnced Dislocations in SiC | Tokyo Tech Research Repository (T2R2)

Publication Information

Title

Japanese:
English:	High-Resolution Electron Microscopy of Neutron-Irradiation-Indnced Dislocations in SiC

Author

Japanese:	T. Yano, T. Iseki.
English:	T. Yano, T. Iseki.

Language

English

Journal/Book name

Japanese:
English:	Phil, Mag. A

Volume, Number, Page

Vol. 62 pp. 421-430

Published date

1990

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English:

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