X-ray Diffractometry and High-Resolution Electron Microscopy of Neutron-Irradiated SiC up to a fluence of 1.9×10<sub>27</sub>n/m<sub>2</sub>

Publication Information

Title

Japanese:
English:	X-ray Diffractometry and High-Resolution Electron Microscopy of Neutron-Irradiated SiC up to a fluence of 1.9×10₂₇n/m₂

Author

Japanese:	T. Yano, H. Miyazaki, M. Akiyoshi, T. Iseki.
English:	T. Yano, H. Miyazaki, M. Akiyoshi, T. Iseki.

Language

English

Journal/Book name

Japanese:
English:	J. Nuclear Materials.

Volume, Number, Page

Vol. 253 pp. 78-86

Published date

1998

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: