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Publication Information
Title
Japanese:
English:
On the Complexity of Fault Testing for Reversible Circuits
Author
Japanese:
Shigeru Ito, Yusuke Ito,
Satoshi Tayu
, Shuichi Ueno.
English:
Shigeru Ito, Yusuke Ito,
Satoshi Tayu
, Shuichi Ueno.
Language
English
Journal/Book name
Japanese:
English:
Technical Report of the IEICE
Volume, Number, Page
Vol. 105 No. 387 pp. 13-16
Published date
Nov. 2005
Publisher
Japanese:
English:
Conference name
Japanese:
English:
電子情報通信学会 回路とシステム研究会
Conference site
Japanese:
English:
山口大学
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Tokyo Institute of Technology All rights reserved.