On the Complexity of Fault Testing for Reversible Circuits

Publication Information

Title

Japanese:
English:	On the Complexity of Fault Testing for Reversible Circuits

Author

Japanese:	Shigeru Ito, Yusuke Ito, Satoshi Tayu, Shuichi Ueno.
English:	Shigeru Ito, Yusuke Ito, Satoshi Tayu, Shuichi Ueno.

Language

English

Journal/Book name

Japanese:
English:	Technical Report of the IEICE

Volume, Number, Page

Vol. 105 No. 387 pp. 13-16

Published date

Nov. 2005

Publisher

Japanese:
English:

Conference name

Japanese:
English:	電子情報通信学会回路とシステム研究会

Conference site

Japanese:
English:	山口大学