On the Complexity of Fault Testing for Reversible Circuits

Publication Information

Title

Japanese:
English:	On the Complexity of Fault Testing for Reversible Circuits

Author

Japanese:	Shigeru Ito, Yusuke Ito, Satoshi Tayu, Shuichi Ueno.
English:	Shigeru Ito, Yusuke Ito, Satoshi Tayu, Shuichi Ueno.

Language

English

Journal/Book name

Japanese:
English:	Proceedings of the 2005 IEICE Society Conference

Volume, Number, Page

No. A-1-26 pp. 26

Published date

Sept. 2005

Publisher

Japanese:
English:

Conference name

Japanese:
English:	2005 IEICE Society Conference

Conference site

Japanese:
English: