Drain-Voltage Dependency of Memory Effects in W-CDMA Base Station Digital Predistortion Linearizers with Compound Semiconductor Power Amplifiers

Publication Information

Title

Japanese:
English:	Drain-Voltage Dependency of Memory Effects in W-CDMA Base Station Digital Predistortion Linearizers with Compound Semiconductor Power Amplifiers

Author

Japanese:	高野健, 大石泰之, 馬庭透, Hiroyuki Hayashi, Toshihide Kikkawa, 荒木純道.
English:	Takeshi Takano, Yasuyuki Oishi, Toru Maniwa, Hiroyuki Hayashi, Toshihide Kikkawa, Kiyomichi Araki.

Language

English

Journal/Book name

Japanese:
English:	MICROWAVE AND OPTICAL TECHNOLOGY LETTERS

Volume, Number, Page

Vol. 45 No. 6 pp. 551-554

Published date

June 2005

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: