Simultaneous STM and UHV electron microscope observation of silicon Nanowires extracted from Si(111) surface

Publication Information

Title

Japanese:
English:	Simultaneous STM and UHV electron microscope observation of silicon Nanowires extracted from Si(111) surface

Author

Japanese:	Y.Naitoh, K.Takayanagi, Y.Ohshima, H.Hirayama.
English:	Y.Naitoh, K.Takayanagi, Y.Ohshima, H.Hirayama.

Language

English

Journal/Book name

Japanese:
English:	Journal of Electron Microscope

Volume, Number, Page

Vol. 49 pp. 211-216

Published date

2000

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: