Contactless Measurement of Electron Mobility in Ferroelectric Gate High-Electron-Mobility Transistor Structures

Publication Information

Title

Japanese:
English:	Contactless Measurement of Electron Mobility in Ferroelectric Gate High-Electron-Mobility Transistor Structures

Author

Japanese:	大見俊一郎.
English:	SHUN-ICHIRO OHMI.

Language

English

Journal/Book name

Japanese:
English:	Japanese Journal of Applied Physics

Volume, Number, Page

Vol. 34 No. 5 pp. L603-L605

Published date

1995

Publisher

Japanese:
English:

Conference name

Japanese:
English:

Conference site

Japanese:
English: