Japanese
Home
Search
Horizontal Search
Publication Search
( Advanced Search )
Patent Search
( Advanced Search )
Research Highlight Search
( Advanced Search )
Researcher Search
Search by Organization
Support
FAQ
T2R2 User Registration
Doctoral thesis registration
Support/Contact
About T2R2
What's T2R2?
Operation Guidance
Leaflets
About file disclosure
Related Links
Tokyo Tech
STAR Search
NII IR Program
Home
>
Help
Publication Information
Title
Japanese:
シリコン単結晶の異方性エッチングを用いた表面粗さ基準片
English:
Author
Japanese:
初澤毅
, 井上尚紀, 早瀬仁則, 坂野憲幾.
English:
初澤毅
, 井上尚紀, 早瀬仁則, 坂野憲幾.
Language
Japanese
Journal/Book name
Japanese:
計測自動制御学会論文集
English:
Trans.of the Society of Instrumunt and Control Engineers
Volume, Number, Page
Vol. 34 No. 10 pp. 1345-1348
Published date
1998
Publisher
Japanese:
English:
Conference name
Japanese:
English:
Conference site
Japanese:
English:
DOI
https://doi.org/10.9746/sicetr1965.34.1345
©2007
Tokyo Institute of Technology All rights reserved.